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Applications and Metrology at Nanometer Scale 2: Measurement Systems, Quantum Engineering and RBDO Method, Volume 10 Pierre Richard Dahoo

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Applications and Metrology at Nanometer Scale 2: Measurement Systems, Quantum Engineering and RBDO Method, Volume 10 Pierre Richard Dahoo Digital Instant Download

Author(s): Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
ISBN(s): 9781786306876, 1786306875
File Details: PDF, 8.30 MB
Year: 2021
Language: English
SKU: EB-44856440 Category: Tags: , ,

Applications and Metrology at Nanometer Scale 2: Measurement Systems, Quantum Engineering and RBDO Method, Volume 10 – Ebook Instant Download/Delivery ISBN(s): 9781786306876,1786306875

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