Introduction to Scanning Tunneling Microscopy 3rd Edition

Introduction to Scanning Tunneling Microscopy 3rd Edition – Ebook Instant Download/Delivery ISBN(s): 9780198856559,0198856555,9780192598561, 0192598562

Product details:

• ISBN-10: 0192598562
• ISBN-13: 9780192598561
• Author: C. Julian Chen

The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. Since the publication of its first edition, this book has been the standard reference book and a graduate-level textbook educating several generations of nano-scientists. In Aug. 1992, the co-inventor of STM, Nobelist Heinrich Rohrer recommended: “The Introduction to Scanning tunnelling Microscopy by C.J. Chen provides a good introduction to the field for newcomers and it also contains valuable material and hints for the experts”.

Table contents:

Chapter 1 Overview

Chapter 2 Tunneling Phenomenon

Chapter 3 Tunneling Matrix Elements

Chapter 4 Atomic Forces

Chapter 5 Atomic Forces and Tunneling

Chapter 6 Nanometer-Scale Imaging

Chapter 7 Atomic-Scale Imaging

Chapter 8 Imaging Wavefunctions

Chapter 9 Nanomechanical Effects

Chapter 10 Piezoelectric Scanner

Chapter 11 Vibration Isolation

Chapter 12 Electronics and Control

Chapter 13 Mechanical Design

Chapter 14 Tip Treatment

Chapter 15 Scanning Tunneling Spectroscopy

Chapter 16 Atomic Force Microscopy

People also search:

what is a scanning tunneling microscope

how does a scanning tunneling microscope work

scanning tunneling microscope how it works

scanning tunneling microscope uses

scanning tunneling microscope definition

scanning tunneling microscope (stm)