Modern Characterization of Electromagnetic Systems and its Associated Metrology (Wiley – IEEE) 1st Edition

Modern Characterization of Electromagnetic Systems and its Associated Metrology (Wiley – IEEE) 1st Edition – Ebook Instant Download/Delivery ISBN(s): 9781119076469,1119076463,9781119076537, 1119076536

Product details:

• ISBN-10: 1119076536
• ISBN-13: 9781119076537
• Author: Tapan K. Sarkar, Magdalena Salazar-Palma, Ming Da Zhu, Heng Chen

Modern Characterization of Electromagnetic Systems introduces a new method of characterizing electromagnetic wave dynamics and measurements based on modern computational and digital signal processing techniques. The techniques are described in terms of both principle and practice, so readers understand what they can achieve by utilizing them.

Table contents:

1 Mathematical Principles Related to Modern System Analysis

2 Matrix Pencil Method (MPM)

3 The Cauchy Method

4 Applications of the Hilbert Transform – A Nonparametric Method for Interpolation/Extrapolation of Data

5 The Source Reconstruction Method

6 Planar Near-Field to Far-Field Transformation Using a Single Moving Probe and a Fixed Probe Arrays

7 Spherical Near-Field to Far-Field Transformation

8 Deconvolving Measured Electromagnetic Responses

9 Performance of Different Functionals for Interpolation/Extrapolation of Near/Far-Field Data

10 Retrieval of Free Space Radiation Patterns from Measured Data in a Non-Anechoic Environment

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