(Ebook PDF) Reliability Engineering Wiley Series in Systems Engineering and Management Third Edition by Elsayed Elsayed ISBN 9781119665908 1119665906 full chapters

• I. System’s Objective and Structural Design
• II. System Prototyping and Analysis of Failure Observations
• III. Design Changes and System Improvement
• IV. System Monitoring During Operation
• V. System Aging, Wear‐out, and Replacement
• VI. System Reaches its Expected Life

CHAPTER 1: RELIABILITY AND HAZARD FUNCTIONS

• 1.1 INTRODUCTION
• 1.2 RELIABILITY DEFINITION AND ESTIMATION
• 1.3 HAZARD FUNCTIONS
• 1.4 MULTIVARIATE HAZARD RATE
• 1.5 COMPETING RISK MODEL AND MIXTURE OF FAILURE RATES
• 1.6 DISCRETE PROBABILITY DISTRIBUTIONS
• 1.7 MEAN TIME TO FAILURE
• 1.8 MEAN RESIDUAL LIFE
• 1.9 TIME OF FIRST FAILURE
• PROBLEMS
• REFERENCES

CHAPTER 2: SYSTEM RELIABILITY EVALUATION

• 2.1 INTRODUCTION
• 2.2 RELIABILITY BLOCK DIAGRAMS
• 2.3 SERIES SYSTEMS
• 2.4 PARALLEL SYSTEMS
• 2.5 PARALLEL–SERIES, SERIES–PARALLEL, AND MIXED‐PARALLEL SYSTEMS
• 2.6 CONSECUTIVE‐k‐OUT‐OF‐n:F SYSTEM
• 2.7 RELIABILITY OF k‐OUT‐OF‐n SYSTEMS
• 2.8 RELIABILITY OF k‐OUT‐OF‐n BALANCED SYSTEMS
• 2.9 COMPLEX RELIABILITY SYSTEMS
• 2.10 SPECIAL NETWORKS
• 2.11 MULTISTATE MODELS
• 2.12 REDUNDANCY
• 2.13 IMPORTANCE MEASURES OF COMPONENTS
• 2.14 WEIGHTED IMPORTANCE MEASURES OF COMPONENTS
• PROBLEMS
• REFERENCES

CHAPTER 3: TIME‐ AND FAILURE‐DEPENDENT RELIABILITY

• 3.1 INTRODUCTION
• 3.2 NONREPAIRABLE SYSTEMS
• 3.3 MEAN TIME TO FAILURE
• 3.4 REPAIRABLE SYSTEMS
• 3.5 AVAILABILITY
• 3.6 DEPENDENT FAILURES
• 3.7 REDUNDANCY AND STANDBY
• PROBLEMS
• REFERENCES

CHAPTER 4: ESTIMATION METHODS OF THE PARAMETERS

• 4.1 INTRODUCTION
• 4.2 METHOD OF MOMENTS
• 4.3 THE LIKELIHOOD FUNCTION
• 4.4 METHOD OF LEAST SQUARES
• 4.5 BAYESIAN APPROACH
• 4.6 BOOTSTRAP METHOD
• 4.7 GENERATION OF FAILURE TIME DATA
• PROBLEMS
• REFERENCES

CHAPTER 5: PARAMETRIC RELIABILITY MODELS

• 5.1 INTRODUCTION
• 5.2 APPROACH 1: HISTORICAL DATA
• 5.3 APPROACH 2: OPERATIONAL LIFE TESTING
• 5.4 APPROACH 3: BURN‐IN TESTING
• 5.5 APPROACH 4: ACCELERATED LIFE TESTING
• 5.6 TYPES OF CENSORING
• 5.7 THE EXPONENTIAL DISTRIBUTION
• 5.8 THE RAYLEIGH DISTRIBUTION
• 5.9 THE WEIBULL DISTRIBUTION
• 5.10 THE LOGNORMAL DISTRIBUTION
• 5.11 THE GAMMA DISTRIBUTION
• 5.12 THE EXTREME VALUE DISTRIBUTION
• 5.13 THE HALF‐LOGISTIC DISTRIBUTION
• 5.14 THE FRECHET DISTRIBUTION
• 5.15 THE BIRNBAUM–SAUNDERS DISTRIBUTION
• 5.16 LINEAR MODELS
• 5.17 MULTICENSORED DATA
• PROBLEMS
• REFERENCES

CHAPTER 6: ACCELERATED LIFE TESTING

• 6.1 INTRODUCTION
• 6.2 TYPES OF RELIABILITY TESTING
• 6.3 ACCELERATED LIFE TESTING
• 6.4 ALT MODELS
• 6.5 STATISTICS‐BASED MODELS: NONPARAMETRIC</