Scanning Nonlinear Dielectric Microscopy 1st edition

Scanning Nonlinear Dielectric Microscopy 1st edition- Ebook PDF Instant Download/DeliveryISBN: 9780081028032, 0081028032

Product details:

• ISBN 10: 0081028032
• ISBN 13: 9780081028032
• Author:Yasuo Cho

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials.

The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry.

Table contents:

1 Principles of scanning nonlinear dielectric microscopy for measuring ferroelectric and dielectric

2 Ferroelectric polarization measurement

3 Three-dimensional polarization measurement

4 Ultrahigh-density ferroelectric data storage using scanning nonlinear dielectric microscopy

5 Linear permittivity measurement by scanning nonlinear dielectric microscopy

6 Noncontact scanning nonlinear dielectric microscopy

7 Scanning nonlinear dielectric potentiometry for measurement of the potential induced by atomic dip

8 Principles of scanning nonlinear dielectric microscopy for semiconductor measurement

9 Carrier distribution measurement in semiconductor materials and devices

10 Super-higher-order scanning nonlinear dielectric microscopy

11 Local deep-level transient spectroscopy

12 Time-resolved scanning nonlinear dielectric microscopy

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